Concord University’s Materials and REE Analysis Center is raising the bar with a series of smart upgrades to its imaging and automation systems. After years of thoughtful refinements aimed at streamlining operations and improving remote access, the centre now offers a clearer, more efficient approach to high‑precision analysis.
Earlier in 2024, a high‑performance Germanium diffracting crystal was installed to sharpen X‑ray spectral resolution and lower detection limits. Building on that success, the centre—working alongside SEMTech Solutions and Advanced Microbeam Inc—has now integrated a custom SEMView8000 system with its ARL SEMQ electron probe microanalyser. This March 2025 upgrade combines advanced electron microscopy imaging with precise X‑ray analysis. The system features a Bruker 730M energy‑dispersive spectrometer and runs on the latest Probe for EPMA 14.x alongside Bruker Esprit 2.6 software on a Windows 11 platform, utilising seven X‑ray spectrometers to deliver high‑performance, automated results.
Underlying these technical advances is a robust infrastructure designed to maintain peak performance. Stable environmental conditions, effective vibration isolation, and a clean electrical supply work together to ensure consistency at every stage. Plus, a dedicated lab for in‑house sample preparation means raw materials are quickly transformed into analysis‑ready forms. This comprehensive approach allows routine quantification of common elements to within 1% relative precision in mere minutes, while trace elements can be detected down to several tens of parts per million.
These enhancements are designed with you in mind—whether you’re an educator, a researcher, or an industry professional. If you’ve ever battled with unreliable equipment or drawn out calibrations, you’ll understand just how valuable a streamlined, automated system can be.
